🇨🇿 Mitutoyo Česko s.r.o. PL

ČIA 2390 • Teplice, Czech Republic • 18 calibration items

Metrology & calibration

Mitutoyo Česko s.r.o. is a calibration laboratory accredited by ČIA under number 2390 (Teplice, Czech Republic). Its accreditation scope covers 18 calibration items in the following areas: Metrology & calibration. Calibrated items include: Roundness testers, Surface profile measuring instruments, Surface roughness measuring instruments, Coordinate measuring machines (CMM). Most frequently used calibration principles: Measurement by a laser interferometer, Measurement with a glass gauge, Measurement using parallel gauge blocks.

At a glance

Accreditation number: ČIA 2390
Calibration items in scope: 18
Types of calibrated items: 10
Calibration principles used: 11
City: Teplice, Czech Republic
Valid until: 21-11-2029

Accreditation number: 2390
Accreditation body: ČIA
Address: Dubská 1635, 415 01 Teplice
City: Teplice, Czech Republic
Division: Laboratorium wzorcujące
Valid until: 21-11-2029

What this laboratory calibrates (10)

Roundness testers — 3 calibration items
Surface profile measuring instruments — 3 calibration items
Surface roughness measuring instruments — 3 calibration items
Coordinate measuring machines (CMM) — 2 calibration items
Coordinate measuring machines equipped with a camera system (VMM) — 2 calibration items
1D measuring instruments (height gauges) — 1 calibration item
Angle measurement error / Profile projectors — 1 calibration item
Error of angle measurement in the XZ plane / Surface profile measuring instruments — 1 calibration item
Measuring microscopes — 1 calibration item
Profile projectors — 1 calibration item

Calibration principles (11)

Measurement by a laser interferometer — 3 calibration items
Measurement with a glass gauge — 3 calibration items
Measurement using parallel gauge blocks — 2 calibration items
Measurement with an optical plane standard — 2 calibration items
Measurement with UDT linearity standard — 2 calibration items
Comparison with a roughness standard — 1 calibration item
Measurement of angle gauge 135° — 1 calibration item
Measurement of glass gauge position by rotating the screen 360° — 1 calibration item
Measurement with reference cylinder — 1 calibration item
Measurement with reference hemisphere — 1 calibration item
Reference ball measurement — 1 calibration item

Certificate information

Certificate date: 09.07.2025

Accreditation scope — calibration items (18)

CMC — lowest stated expanded measurement uncertainty (ILAC-P14, EA-4/02 M); if not stated otherwise, coverage probability approx. 95 % and values without a unit are relative to the measured value. The uncertainty of a specific calibration may be higher.

No.	Calibrated quantity / subject of calibration	Nominal range / parameters / CMC	Calibration principle	Calibration procedure
Calibration items
1	Coordinate measuring machines (CMM)	Calibration – length Spatial length — 0 m to 5 m · CMC (0,3L + 0,1) µm CMC for the field of measured quantity: Length	Measurement by a laser interferometer	MCZ-PI-KL_SD15_KP01 (ČSN EN ISO 10360-2, ČSN EN ISO 10360-5)
2	Coordinate measuring machines (CMM)	Calibration – length Sensing system error — -1 mm to 1 mm · CMC 0,2 µm CMC for the field of measured quantity: Length	Reference ball measurement	MCZ-PI-KL_SD15_KP01 (ČSN EN ISO 10360-2, ČSN EN ISO 10360-5)
3	Coordinate measuring machines equipped with a camera system (VMM)	Calibration – length 0 m to 1 m · CMC (2,4L + 0,2) µm axes X, Y — 0 m to 1 m · CMC (2,4L + 0,2) µm CMC for the field of measured quantity: Length	Measurement with a glass gauge	MCZ-PI-KL_SD15_KP06
4	Coordinate measuring machines equipped with a camera system (VMM)	Calibration – length Z-axis — 0 m to 0,3 m · CMC (3,1L + 0,3) µm CMC for the field of measured quantity: Length	Measurement using parallel gauge blocks	MCZ-PI-KL_SD15_KP06
5	Surface roughness measuring instruments	Calibration – length Ra — 0,1 µm to 50 µm · CMC 3,4 % Rz — 0,01 µm to 50 µm · CMC 2,4 % Rsm — 0,1 µm to 400 µm · CMC 0,6 % CMC for the field of measured quantity: Length	Comparison with a roughness standard	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
6	Surface roughness measuring instruments	Calibration – length Linearity measurement error — -400 µm to 400 µm · CMC 4 µm CMC for the field of measured quantity: Length	Measurement with UDT linearity standard	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
7	Surface roughness measuring instruments	Calibration – length Straightness measurement error — -15 µm to 15 µm · CMC 0,06 µm CMC for the field of measured quantity: Length	Measurement with an optical plane standard	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
8	Surface profile measuring instruments	Calibration – length axes X, Y — 0 mm to 200 mm · CMC (0,3L + 0,2) µm CMC for the field of measured quantity: Length	Measurement by a laser interferometer	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
9	Surface profile measuring instruments	Calibration – length Z-axis — 0 mm to 60 mm · CMC (0,3L + 0,2 µm CMC for the field of measured quantity: Length	Measurement using parallel gauge blocks	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
10	Surface profile measuring instruments	Calibration – length Straightness measurement error — -15 µm to 15 µm · CMC 0,06 µm CMC for the field of measured quantity: Length	Measurement with an optical plane standard	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
11	Profile projectors	Calibration – length 0 mm to 200 mm · CMC (8,9L + 1,2) µm Parallelity PXY — -200 µm to 200 µm · CMC 1 µm Cross hair position ECH — -200 µm to 200 µm · CMC 4 µm Magnification error — -1 % to 1 % · CMC 0,01 % (abs.) CMC for the field of measured quantity: Length	Measurement with a glass gauge	MCZ-PI-KL_SD15_KP03
12	Measuring microscopes	Calibration – length 0 mm to 400 mm · CMC (8,9L + 1,2) µm Parallelity PXY — -200 µm to 200 µm · CMC 1 µm CMC for the field of measured quantity: Length	Measurement with a glass gauge	MCZ-PI-KL_SD15_KP03
13	1D measuring instruments (height gauges)	Calibration – length 0 m to 1 m · CMC (0,23L + 0,05) µm CMC for the field of measured quantity: Length	Measurement by a laser interferometer	MCZ-PI-KL_SD15_KP04
14	Roundness testers	Calibration – length Sensor linearity measurement error — -400 µm to 400 µm · CMC 4 µm CMC for the field of measured quantity: Length	Measurement with UDT linearity standard	MCZ-PI-KL_SD15_KP05
15	Roundness testers	Calibration – length Spindle axial runout — -200 µm to 200 µm · CMC 0,02 µm Spindle radial runout — -200 µm to 200 µm · CMC 0,04 µm CMC for the field of measured quantity: Length	Measurement with reference hemisphere	MCZ-PI-KL_SD15_KP05
16	Roundness testers	Calibration – length Cylindricity — 0 µm to 200 µm · CMC 1,8 µm CMC for the field of measured quantity: Length	Measurement with reference cylinder	MCZ-PI-KL_SD15_KP05
17	Error of angle measurement in the XZ plane / Surface profile measuring instruments	Calibration – plane angle 135° · CMC 0,0034° CMC for the field of measured quantity: Plane angle	Measurement of angle gauge 135°	MCZ-PI-KL_SD15_KP02 (ČSN EN ISO 3274, ČSN EN ISO 12179)
18	Angle measurement error / Profile projectors	Calibration – plane angle 360° · CMC 0,5´ CMC for the field of measured quantity: Plane angle	Measurement of glass gauge position by rotating the screen 360°	MCZ-PI-KL_SD15_KP03

Reference standards (10)

MCZ-PI-KL_SD15_KP01

MCZ-PI-KL_SD15_KP02

MCZ-PI-KL_SD15_KP03

MCZ-PI-KL_SD15_KP04

MCZ-PI-KL_SD15_KP05

MCZ-PI-KL_SD15_KP06

ČSN EN ISO 10360-2

ČSN EN ISO 10360-5

ČSN EN ISO 12179

ČSN EN ISO 3274

The same scope as data (JSON): https://labcoda.pl/api/accreditation-scopes/labs/CZ/2390