🇨🇿 Wabtec Inspection Technologies Czech s.r.o. PL
Metrology & calibration
Wabtec Inspection Technologies Czech s.r.o. is a calibration laboratory accredited by ČIA under number 2371 (Praha 6, Czech Republic). Its accreditation scope covers 53 calibration items in the following areas: Metrology & calibration. Calibrated items include: Olympus/Evident Omniscan series ultrasonic flaw detectors, Olympus/Evident ultrasonic flaw detectors by automatic method, Olympus/Evident Nortec 500 series eddy current flaw detectors, Olympus/Evident BondMaster 600 series eddy current flaw detectors. Most frequently used calibration principles: Instrument display reading, Measurement with an oscilloscope, Calculation from measured values (ČSN EN 12668-1).
At a glance
- Accreditation number: ČIA 2371
- Calibration items in scope: 53
- Types of calibrated items: 12
- Calibration principles used: 38
- City: Praha 6, Czech Republic
- Valid until: 11-09-2030
- Accreditation number
- 2371
- Accreditation body
- ČIA
- Address
- Evropská 16/176, Vokovice, 160 00 Praha 6
- City
- Praha 6, Czech Republic
- Division
- Laboratorium wzorcujące NDT
- Valid until
- 11-09-2030
What this laboratory calibrates (12)
- Olympus/Evident Omniscan series ultrasonic flaw detectors — 22 calibration items
- Olympus/Evident ultrasonic flaw detectors by automatic method — 9 calibration items
- Olympus/Evident Nortec 500 series eddy current flaw detectors — 5 calibration items
- Olympus/Evident BondMaster 600 series eddy current flaw detectors — 4 calibration items
- Olympus/Evident Nortec 600 series eddy current flaw detectors — 4 calibration items
- Olympus/Evident ultrasonic thickness gauges by automatic method — 3 calibration items
- DC resistance — 1 calibration item
- DC voltage / DC voltage sources — 1 calibration item
- HF attenuation / HF attenuator — 1 calibration item
- HF voltage, peak-to-peak value / Sources of peak-to-peak voltage — 1 calibration item
- Magnamike thickness gauges — 1 calibration item
- Ultrasonic thickness gauges — 1 calibration item
Calibration principles (38)
- Instrument display reading — 3 calibration items
- Measurement with an oscilloscope — 3 calibration items
- Calculation from measured values (ČSN EN 12668-1) — 2 calibration items
- Calculation from measured values (ČSN EN ISO 22232-1) — 2 calibration items
- Comparison with a length standard value — 2 calibration items
- Comparison with a reference attenuator — 2 calibration items
- Comparison with a reference attenuator (ČSN EN 12668-1) — 2 calibration items
- Direct measurement by a multimeter — 2 calibration items
- Instrument display reading (ČSN EN 12668-1) — 2 calibration items
- Instrument display reading (ČSN EN ISO 22232-1) — 2 calibration items
- Measurement by a multimeter — 2 calibration items
- Measurement with an oscilloscope (ČSN EN ISO 22232-1) — 2 calibration items
- Simulation by el. signal (ČSN EN 12668-1) — 2 calibration items
- Calculation from measured values — 1 calibration item
- Calculation from measured values (ČSN EN ISO 15548-1) — 1 calibration item
- and 23 more
Certificate information
- Certificate date
- 26.01.2026
Accreditation scope — calibration items (53)
| No. | Calibrated quantity / subject of calibration | Nominal range / parameters / CMC | Calibration principle | Calibration procedure | |
|---|---|---|---|---|---|
| Calibration items | |||||
| 1 | Ultrasonic thickness gauges | Calibration – length 0,150 mm to 5,100 mm · CMC 0,005 mm 5,100 mm to 100,00 mm · CMC 0,01 mm CMC for the field of measured quantity: Length |
Comparison with a length standard value | DOC-23-00018 | |
| 2 | Magnamike thickness gauges | Calibration – length 0,250 mm to 25,340 mm · CMC 0,005 mm CMC for the field of measured quantity: Length |
Comparison with a length standard value | DOC-23-00018 | |
| 3 | Olympus/Evident ultrasonic thickness gauges by automatic method | Calibration – testing of properties and defects of materials Pulse repetition frequency — 3 Hz to 3 kHz · CMC 1 % Transmit pulse voltage — 2 V to 500 V · CMC 2 % Pulse tail — 2 V to 500 V · CMC 2 % Pulse rise time — 2 ns to 1200 ns · CMC 0,8 % Pulse duration — 2 ns to 1200 ns · CMC 0,8 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN 15317) | DOC-23-00018 | |
| 4 | Olympus/Evident ultrasonic thickness gauges by automatic method | Calibration – testing of properties and defects of materials Current operating range — 0,1 A to 2 A · CMC 1,5 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Power supply reading (ČSN EN 15317) | DOC-23-00018 | |
| 5 | Olympus/Evident ultrasonic thickness gauges by automatic method | Calibration – testing of properties and defects of materials Precision and resolution — 0,25 mm to 100 mm · CMC 0,15 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a length standard value (ČSN EN 15317) | DOC-23-00018 | |
| 6 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Stability after heating, signal amplitude — 5 % SH to 100 % SH · CMC 0,14 % SH Stability after heating, signal position — 5 % SW to 100 % SW · CMC 0,12 % SW Display instability, signal amplitude — 5 % SH to 100 % SH · CMC 0,14 % SH Display instability, signal position — 5 % SW to 100 % SW · CMC 0,12 % SW Stability at voltage fluctuation, signal amplitude — 5 % SH to 100 % SH · CMC 0,14 % SH Stability at voltage fluctuation, signal position — 5 % SW to 100 % SW · CMC 0,12 % SW Transmit pulse voltage — 2 V to 500 V · CMC 3 % Pulse tail — 2 V to 500 V · CMC 3 % Pulse rise time — 2 ns to 1100 ns · CMC 2 % Pulse duration — 2 ns to 1100 ns · CMC 2 % Amplifier frequency response — 0,1 MHz to 26,5 MHz · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN 12668-1) | DOC-23-00019 | |
| 7 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Equivalent input noise level — 1 nV/√Hz to 80 nV/√Hz · CMC 7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN 12668-1) | DOC-23-00019 | |
| 8 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Calibrated attenuator accuracy — 0 dB to 110 dB · CMC 0,7 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator (ČSN EN 12668-1) | DOC-23-00019 | |
| 9 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Display unit vertical linearity — 5 % SH to 100 % SH · CMC 1 % SH Time base linearity — 5 % SW to 100 % SW · CMC 0,0004 % SW Time resolution — 50 ns to 150 ns · CMC 2 ns CMC for the field of measured quantity: Testing of properties and defects of materials |
Simulation by el. signal (ČSN EN 12668-1) | DOC-23-00019 | |
| 10 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Transmit pulse voltage — 2 V to 500 V · CMC 3 % Pulse rise time — 2 ns to 1100 ns · CMC 2 % Pulse duration — 2 ns to 1100 ns · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN ISO 22232-1) | DOC-23-00019 | |
| 11 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Amplifier frequency response — 0,1 MHz to 26,5 MHz · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN ISO 22232-1) | DOC-23-00019 | |
| 12 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Equivalent input noise level — 1 nV/√Hz to 80 nV/√Hz · CMC 7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN ISO 22232-1) | DOC-23-00019 | |
| 13 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Calibrated attenuator accuracy — 0 dB to 110 dB · CMC 0,7 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference standard (ČSN EN ISO 22232-1) | DOC-23-00019 | |
| 14 | Olympus/Evident ultrasonic flaw detectors by automatic method | Calibration – testing of properties and defects of materials Display unit vertical linearity — 5 % SH to 100 % SH · CMC 1 % SH Time base linearity — 5 % SW to 100 % SW · CMC 0,0004 % SW CMC for the field of measured quantity: Testing of properties and defects of materials |
Simulation by el. signal (ČSN EN ISO 22232-1) | DOC-23-00019 | |
| 15 | Olympus/Evident Nortec 500 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Instrument current demand — 550 mA to 850 mA · CMC 0,006 mA Instrument switching-off — 7,0 V to 8,0 V · CMC 0,06 V Instrument charging current — 1,0 A to 1,7 A · CMC 0,5 mA CMC for the field of measured quantity: Testing of properties and defects of materials |
Power supply reading | DOC-23-00021 | |
| 16 | Olympus/Evident Nortec 500 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Output signal amplitude — 0,4 V to 4,2 V · CMC 0,05 mV Instrument driving pulse — 8,20 Vp-p to 10,27 Vp-p · CMC 0,06 Vp-p Instrument output frequency — 0 Hz to 100 Hz · CMC 0,1 Hz Instrument output frequency — 0 MHz to 12 MHz · CMC 12·10⁻⁶ MHz CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement by a multimeter | DOC-23-00021 | |
| 17 | Olympus/Evident Nortec 500 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Filter test — 2 Hz to 8 Hz · CMC 0,057 Hz CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading | DOC-23-00021 | |
| 18 | Olympus/Evident Nortec 500 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Scanner output frequency, for 1200 RPM — 0 Hz to 20 Hz · CMC 0,02 Hz Scanner output frequency, for 3000 RPM — 0 Hz to 50 Hz · CMC 0,05 Hz Additional outputs Frequency No. 1 & No. 2 — 5 V · CMC 0,06 V CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope | DOC-23-00021 | |
| 19 | Olympus/Evident Nortec 500 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Instrument conductivity — 30 % IACS to 60 % IACS · CMC 0,17 % IACS CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference standard | DOC-23-00021 | |
| 20 | Olympus/Evident Nortec 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Excitation frequency — 10·10⁻⁶ MHz to 10 MHz · CMC 2 % Harmonic distortion — 10·10⁻⁶ MHz to 10 MHz · CMC 0,3 % Maximum output voltage — 1,8 Vp-p to 2,2 Vp-p · CMC 0,3 % Maximum permissible input voltage — 0,1 Vp-p to 14,4 Vp-p · CMC 0,5 % Signal processing frequency response — 0,1 kHz to 2 kHz · CMC 0,1 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN ISO 15548-1) | DOC-23-00021 | |
| 21 | Olympus/Evident Nortec 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Phase linearity — 0° to 360° · CMC 0,002° CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN ISO 15548-1) | DOC-23-00021 | |
| 22 | Olympus/Evident Nortec 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Gain setting accuracy — 0 dB to 100 dB · CMC 0,07 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator (ČSN EN ISO 15548-1) | DOC-23-00021 | |
| 23 | Olympus/Evident Nortec 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Instrument maximum noise — 1,8 µV to 15,0 µV · CMC 0,5 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN ISO 15548-1) | DOC-23-00021 | |
| 24 | Olympus/Evident BondMaster 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Excitation frequency — 1 kHz to 500 kHz · CMC 2 % Harmonic distortion — 10·10⁻⁶ MHz to 10 MHz · CMC 0,3 % Maximum output voltage of TX generator (MIA, RESONANCE) and HV generator (MIA) — 0,9 Vp-p to 140 Vp-p · CMC 0,3 % Input voltage linearity — 0,01 % to 0,75 % · CMC 0,5 % Signal processing frequency response — 70 Hz to 80 Hz · CMC 0,1 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope | DOC-23-00021 | |
| 25 | Olympus/Evident BondMaster 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Phase linearity — 0° to 360° · CMC 0,002° CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading | DOC-23-00021 | |
| 26 | Olympus/Evident BondMaster 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Gain setting accuracy — 0 dB to 100 dB · CMC 0,07 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator | DOC-23-00021 | |
| 27 | Olympus/Evident BondMaster 600 series eddy current flaw detectors | Calibration – testing of properties and defects of materials Instrument maximum noise — 1,8 µV to 15 µV · CMC 0,5 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values | DOC-23-00021 | |
| 28 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Stability after heating (mm), signal amplitude — 5 % SH to 100 % SH · CMC 0,14 % SH Stability after heating (mm), signal position — 5 % SW to 100 % SW · CMC 0,12 % SW Display unit instability, signal amplitude (mm) — 5 % SH to 100 % SH · CMC 0,14 % SH Display unit instability, signal position (mm) — 5 % SW to 100 % SW · CMC 0,12 % SW Stability at voltage variations, signal amplitude (mm) — 5 % SH to 100 % SH · CMC 0,14 % SH Stability at voltage variations, signal position (mm) — 5 % SW to 100 % SW · CMC 0,12 % SW CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display signal reading (ČSN EN 12668-1) | DOC-23-00022 | |
| 29 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Transmit pulse voltage — 2 V to 500 V · CMC 3 % Pulse tail — 2 V to 500 V · CMC 3 % Pulse rise time — 2 ns to 1100 ns · CMC 2 % Pulse duration — 2 ns to 1100 ns · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN 12668-1) | DOC-23-00022 | |
| 30 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Amplifier frequency response — 0,1 MHz to 26,5 MHz · CMC 2 % Display unit vertical linearity (mm) — 5 % SH to 100 % SH · CMC 1,0 % SH CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN 12668-1) | DOC-23-00022 | |
| 31 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Equivalent input noise level — 1 nV/√Hz to 80 nV/√Hz · CMC 7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN 12668-1) | DOC-23-00022 | |
| 32 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Calibrated attenuator accuracy — 0 dB to 110 dB · CMC 0,7 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator (ČSN EN 12668-1) | DOC-23-00022 | |
| 33 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Time base linearity — 0 µs to 5125 µs · CMC 0,004 µs CMC for the field of measured quantity: Testing of properties and defects of materials |
Simulation by el. signal (ČSN EN 12668-1) | DOC-23-00022 | |
| 34 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Transmit pulse voltage (PA) — 2 V to 500 V · CMC 3 % Pulse rise time (PA) — 2 ns to 1100 ns · CMC 2 % Pulse duration (PA) — 2 ns to 1100 ns · CMC 2 % Emission delay (PA) — 0 ns to 5 ns · CMC 0,08 ns Instrument absolute gain (PA) — 5 % SH to 100 % SH · CMC 0,23 % SH Transmit pulse voltage (UT) — 2 V to 500 V · CMC 3 % Pulse rise time (UT) — 2 ns to 1100 ns · CMC 2 % Pulse duration (UT) — 2 ns to 1100 ns · CMC 2 % Instrument absolute gain (UT) — 5 % SH to 100 % SH · CMC 0,23 % SH Instrument absolute gain (ECA) — 0 V to 1,5 V · CMC 0,01 V Generator excitation frequency (ECA) — 0,1 MHz to 6,1 MHz · CMC 2,0 % Output voltage verification (ECA), frequency — 1 Hz to 20 Hz · CMC 2,0 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope | DOC-23-00022 | |
| 35 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Bandwidth (PA) — 0,2 MHz to 26,5 MHz · CMC 2 % Display linearity (PA) — 5 % SH to 100 % SH · CMC 0,23 % SH Bandwidth (UT) — 0,2 MHz to 26,5 MHz · CMC 2 % Display linearity — 5 % SH to 100 % SH · CMC 0,23 % SH Channel gain deviation — 5 % SH to 100 % SH · CMC 0,2 % SH CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading | DOC-23-00022 | |
| 36 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Display linearity delay (PA) — 0,01 µs to 10,01 µs · CMC 0,001 µs Display linearity delay — 0,01 µs to 10,01 µs · CMC 0,001 µs Transmit channel position deviation — 0 ns to 5 ns · CMC 0,07 ns CMC for the field of measured quantity: Testing of properties and defects of materials |
Simulation by el. signal | DOC-23-00022 | |
| 37 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Transmit pulse voltage (UT) — 2 V to 500 V · CMC 3 % Pulse rise time (UT) — 2 ns to 1100 ns · CMC 2 % Pulse duration (UT) — 2 ns to 1100 ns · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN ISO 22232-1) | DOC-23-00022 | |
| 38 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Amplifier frequency response — 0,2 MHz to 26,5 MHz · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Signal generation (ČSN EN ISO 22232-1) | DOC-23-00022 | |
| 39 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Equivalent input noise level — 1 nV/√Hz to 80 nV/√Hz · CMC 7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN ISO 22232-1) | DOC-23-00022 | |
| 40 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Calibrated attenuator accuracy — 0 dB to 110 dB · CMC 0,7 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator (ČSN EN ISO 22232-1) | DOC-23-00022 | |
| 41 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Display unit vertical linearity (mm) — 5 % SH to 100 % SH · CMC 1,0 % SH CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN ISO 22232-1) | DOC-23-00022 | |
| 42 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Transmit pulse voltage — 2 V to 500 V · CMC 3 % Pulse rise time — 2 ns to 1100 ns · CMC 2 % Pulse duration — 2 ns to 1100 ns · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement with an oscilloscope (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 43 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Delay linearity — 0 ns to 100 ns · CMC 0,07 ns Linearity of individual transmit pulses — 0 ns to 55 ns · CMC 0,07 ns CMC for the field of measured quantity: Testing of properties and defects of materials |
Simulation by el. signal (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 44 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Amplifier frequency response — 0,2 MHz to 29 MHz · CMC 2 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Signal generation (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 45 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Channel gain deviation — 5 % SH to 100 % SH · CMC 0,2 % SH Vertical display linearity (mm) — 5 % SH to 800 % SH · CMC 1 % SH CMC for the field of measured quantity: Testing of properties and defects of materials |
Instrument display reading (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 46 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Equivalent input noise level — 1 nV/√Hz to 80 nV/√Hz · CMC 7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Calculation from measured values (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 47 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Calibrated attenuator accuracy — 0 dB to 110 dB · CMC 0,7 dB CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator (ČSN EN ISO 18563-1) | DOC-23-00022 | |
| 48 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Gain linearity (ECA) — 0,1 % to 3,0 % · CMC 0,7 % CMC for the field of measured quantity: Testing of properties and defects of materials |
Comparison with a reference attenuator | DOC-23-00022 | |
| 49 | Olympus/Evident Omniscan series ultrasonic flaw detectors | Calibration – testing of properties and defects of materials Output voltage verification (ECA), voltage — 1 V to 10 V · CMC 0,7 % General test (ECA), voltage on a connector — 0 V to 12 V · CMC 0,08 V General test (ECA), voltage on a BNC connector — 0 V to 12 V · CMC 0,08 V CMC for the field of measured quantity: Testing of properties and defects of materials |
Measurement by a multimeter | DOC-23-00022 | |
| 50 | DC voltage / DC voltage sources | Calibration – electrical quantities 0 mV to 10 mV · CMC 8 µV 10 mV to 100 mV · CMC 17 µV 100 mV to 1 V · CMC 88 µV 1 V to 10 V · CMC 0,8 mV 10 V to 100 V · CMC 10 mV 100 to 1000 V · CMC 65 mV CMC for the field of measured quantity: Electrical quantities |
Direct measurement by a multimeter | DOC-25-00057 | |
| 51 | DC resistance | Calibration – electrical quantities 0 Ω to 10 Ω · CMC 10 mΩ 10 Ω to 100 Ω · CMC 29 mΩ 100 Ω to 1 kΩ · CMC 0,2 Ω 1 kΩ to 10 kΩ · CMC 2 Ω 10 kΩ to 100 kΩ · CMC 20 Ω 100 kΩ to 1 MΩ · CMC 0,2 kΩ 1 MΩ to 10 MΩ · CMC 8 kΩ 10 MΩ to 100 MΩ · CMC 0,9 MΩ CMC for the field of measured quantity: Electrical quantities |
Direct measurement by a multimeter | DOC-25-00057 | |
| 52 | HF voltage, peak-to-peak value / Sources of peak-to-peak voltage | Calibration – electrical quantities 0,1 MHz to 100 MHz — 2 mV to 40 V · CMC 3 % + 0,1 mV CMC for the field of measured quantity: Electrical quantities |
Measurement with an oscilloscope with 50 Ω external load | DOC-25-00057 | |
| 53 | HF attenuation / HF attenuator | Calibration – electrical quantities 0,25 MHz to 100 MHz — 0 dB to 50 dB · CMC 0,17 dB 0,25 MHz to 100 MHz — 50 dB to 60 dB · CMC 0,21 dB 0,25 MHz to 100 MHz — 60 dB to 70 dB · CMC 0,28 dB 0,25 MHz to 100 MHz — 70 dB to 80 dB · CMC 0,37 dB 0,25 MHz to 100 MHz — 80 dB to 90 dB · CMC 0,57 dB CMC for the field of measured quantity: Electrical quantities |
Measurement by a vector analyzer | DOC-25-00057 | |
Reference standards (5)
DOC-23-00018
DOC-23-00019
DOC-23-00021
DOC-23-00022
DOC-25-00057