🇵🇱 Politechnika Wrocławska PL
Other
Politechnika Wrocławska is a calibration laboratory accredited by PCA under number AP 078 (Wrocław, Poland). Its accreditation scope covers 5 calibration items in the following areas: Other. Calibrated items include: Electric field strength meters, Magnetic field strength meters, Magnetic flux density meters, Electrostatic field strength meters. Most frequently used calibration principles: Indirect method.
At a glance
- Accreditation number: PCA AP 078
- Calibration items in scope: 5
- Types of calibrated items: 7
- Calibration principles used: 1
- City: Wrocław, Poland
- Valid until: 22-09-2029
- Accreditation number
- AP 078
- Accreditation body
- PCA
- Address
- ul. Janiszewskiego 9, 50-372 Wrocław
- City
- Wrocław, Poland
- Division
- Department of Telecommunications and Teleinformatics, Electromagnetic Field Standards and Metrology Laboratory
- Valid until
- 22-09-2029
What this laboratory calibrates (7)
- Electric field strength meters — 2 calibration items
- Magnetic field strength meters — 2 calibration items
- Magnetic flux density meters — 2 calibration items
- Electrostatic field strength meters — 1 calibration item
- Induced current meters — 1 calibration item
- Magnetostatic field meters — 1 calibration item
- Power density meters — 1 calibration item
Calibration principles (1)
- Indirect method — 5 calibration items
Laboratory locations
- Politechnika Wrocławska (main site) — ul. Janiszewskiego 9, 50-372 Wrocław
- DEPARTMENT OF TELECOMMUNICATIONS AND TELEINFORMATICS, ELECTROMAGNETIC FIELD STANDARDS AND METROLOGY LABORATORY — ul. Zygmunta Janiszewskiego 9, 50-372 Wrocław
Certificate information
- Issue date
- 01.09.2025
- Issue no.
- 17
- Certificate date
- 27.06.2022
- Accreditation cycle
- 01.09.2025 — 22.09.2029
- Approved by
- Katarzyna Wiśniewska
Accreditation scope — calibration items (5)
| No. | Calibrated quantity / subject of calibration | Nominal range / parameters / CMC | Calibration principle | Calibration procedure | |
|---|---|---|---|---|---|
| Electromagnetic Field Standards and Metrology Laboratory, Place of activity: S | |||||
| 1 | Magnetostatic field meters Magnetic flux density meters |
Internal procedures PrW-1, PrW-4 based on IEEE 1309-2013 0 Hz 0,01 kA/m to 10 kA/m; Measurement uncertainty for CMC 2,8 % 0 Hz 10 kA/m to 1000 kA/m; Measurement uncertainty for CMC 1,0 % Magnetic quantities |
Indirect method | Procedury wewnętrzne PrW-1, PrW-4 | IEEE 1309-2013 | |
| 2 | Magnetic field strength meters Magnetic flux density meters |
Internal procedures PrW-1, PrW-4 based on IEEE 1309-2013 50 Hz 0,1 A/m to 50 kA/m; Measurement uncertainty for CMC 2,8 % 1 Hz to 1000 Hz 0,01 A/m to 10 kA/m; Measurement uncertainty for CMC 2,8 % 0,001 MHz to 1 MHz 0,1 A/m to 250 A/m; Measurement uncertainty for CMC 5 % 1 MHz to 10 MHz 0,001 A/m to 200 A/m; Measurement uncertainty for CMC 5 % 10 MHz to 100 MHz 0,001 A/m to 20 A/m; Measurement uncertainty for CMC 5 % Electromagnetic quantities |
Indirect method | Procedury wewnętrzne PrW-1, PrW-4 | IEEE 1309-2013 | |
| 3 | Electrostatic field strength meters Electric field strength meters Magnetic field strength meters |
Internal procedures PrW-2, PrW-4 based on IEEE 1309-2013 E field 0 MHz to 50 Hz 10 V/m to 50kV/m; Measurement uncertainty for CMC 2,8 % E field 0,01 kHz to 100 kHz 1 V/m to 2 kV/m; Measurement uncertainty for CMC 2,8 % E field 0,01 MHz to 220 MHz 0,001 V/m to 2000 V/m; Measurement uncertainty for CMC 5 % E field 10 MHz to 1000 MHz 0,001 V/m to 1000 V/m; Measurement uncertainty for CMC 5 % H field 0,01 MHz to 220 MHz 0,3 mA/m to 5 A/m; Measurement uncertainty for CMC 5 % H field 10 MHz to 1000 MHz 3 mA/m to 2,5 A/m; Measurement uncertainty for CMC 5 % Electromagnetic quantities |
Indirect method | Procedury wewnętrzne PrW-2, PrW-4 | IEEE 1309-2013 | |
| 4 | Electric field strength meters Power density meters |
Internal procedures PrW-3, PrW-4 based on IEEE 1309-2013 1 GHz to 10 GHz 0,00001 W/m² to 50 W/m²; 0,06 V/m to 137 V/m; Measurement uncertainty for CMC 15 % 10 GHz to 20 GHz 0,001 W/m² to 50 W/m²; (0,6 V/m to 137 V/m; Measurement uncertainty for CMC 25 % 20 GHz to 50 GHz 0,001 W/m² to 50 W/m²; 0,6 V/m to 137 V/m; Measurement uncertainty for CMC 35 % 50 GHz to 90 GHz 0,001 W/m² to 0,5 W/m²; 0,6 V/m to 14 V/m; Measurement uncertainty for CMC 38 % Electromagnetic quantities |
Indirect method | Procedury wewnętrzne PrW-3, PrW-4 | IEEE 1309-2013 | |
| 5 | Induced current meters | Internal procedures PrW-5, PrW-4 based on IEEE 1309-2013 0,0001 MHz to 110 MHz 0,001 A to 1,5 A; Measurement uncertainty for CMC 10 % Electromagnetic quantities |
Indirect method | Procedury wewnętrzne PrW-5, PrW-4 | IEEE 1309-2013 | |
Reference standards (5)
IEEE 1309-2013
Procedury wewnętrzne PrW-1, PrW-4
Procedury wewnętrzne PrW-2, PrW-4
Procedury wewnętrzne PrW-3, PrW-4
Procedury wewnętrzne PrW-5, PrW-4