{"lab":{"_id":"69ad52a3de79e566650fb9a3","accr_number":"AB 1804","country":"PL","accr_body":"PCA","address":"ul. Słoneczna 7, 55-100 Raszów, LABORATORIUM, ul. Wrocławska 9","categories":["electronics"],"city":"Raszów","imported_at":"2026-03-08T10:42:43.265Z","methods_count":6,"name":"KONTECH MAŁECKI KRZYSZTOF","parse_status":"parsed","parse_version":2,"pdf_files":["AB_1804.pdf"],"scope_summary":"","search_text":"kontech małecki krzysztof ul. słoneczna 7, 55-100 raszów, laboratorium, ul. wrocławska 9 electronics pharma other","status":"active","updated_at":"2026-03-08T14:50:56.417Z","valid_from":"","valid_until":"","website":"","parsed_at":"2026-03-08T14:50:56.417Z","email_confidence":"high","email_mx":true,"email_source":"https://bip.pca.gov.pl/wykazy-i-archiwa/akredytacje-aktywne/laboratoria-badawcze/AB%201804,podmiot.html","fields_of_testing":[{"codes":"N/6; N/54","pl":"Badanie właściwości fizycznych wyrobów elektrycznych i elektronicznych","en":"Physical properties tests of electrical and electronic products"},{"codes":"G/6; G/17; G/54","pl":"Badania dotyczące inżynierii środowiska wyrobów elektrycznych i elektronicznych, wyrobów innych","en":"Environmental engineering tests of electrical and electronic products, other products"}],"issue":{"no":"3","date":"24.09.2025"},"parse_date":"2026-07-20T07:09:29.888Z","parse_source":"script-pdfplumber","map_coord":[51.291668,17.087828],"map_geo":"nominatim-street","has_zh":true,"has_en":true,"category_counts":{"electronics":6},"category_scores":{"electronics":6}},"methods":[{"_id":"6a5dc9a9f1c10c8ce825a070","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne","test_object_en":"Low-voltage electronic and electrical products, including lighting and information technology products","methodology":"Odporność na zimno Próba A","methodology_en":"Resistance to cold Test A","parameters":[{"name":"Zakres","range":"do -40 °C"}],"parameters_en":[{"name":"Range","range":"do -40 °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na zimno Próba A\nZakres do -40 °C","reference":"PN-EN 60068-2-1:2009","norm_bases":["PN-EN 60068-2-1:2009"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne Odporność na zimno Próba A\nZakres do -40 °C PN-EN 60068-2-1:2009 Wyroby elektroniczne i elektryczne niskiego napiecia, w tym oswietleniowe i informatyczne Odpornosc na zimno Proba A\nZakres do -40 °C PN-EN 60068-2-1:2009","categories":["electronics"],"row_index":0,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐低温性 试验 A","parameters_zh":[{"name":"范围","range":"do -40 °C"}],"search_zh":"低压电子与电气产品，含照明与信息技术产品 耐低温性 试验 A 范围 PN-EN 60068-2-1:2009","test_object_zh":"低压电子与电气产品，含照明与信息技术产品","search_en":"Low-voltage electronic and electrical products, including lighting and information technology products Resistance to cold Test A Range PN-EN 60068-2-1:2009"},{"_id":"6a5dc9a9f1c10c8ce825a071","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne","test_object_en":"Low-voltage electronic and electrical products, including lighting and information technology products","methodology":"Odporność na suche gorąco Próba B","methodology_en":"Resistance to dry heat Test B","parameters":[{"name":"Zakres","range":"do +105 °C"}],"parameters_en":[{"name":"Range","range":"do +105 °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na suche gorąco Próba B\nZakres do +105 °C","reference":"PN-EN 60068-2-2:2009","norm_bases":["PN-EN 60068-2-2:2009"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne Odporność na suche gorąco Próba B\nZakres do +105 °C PN-EN 60068-2-2:2009 Wyroby elektroniczne i elektryczne niskiego napiecia, w tym oswietleniowe i informatyczne Odpornosc na suche goraco Proba B\nZakres do +105 °C PN-EN 60068-2-2:2009","categories":["electronics"],"row_index":1,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐干热性 试验 B","parameters_zh":[{"name":"范围","range":"do +105 °C"}],"search_zh":"低压电子与电气产品，含照明与信息技术产品 耐干热性 试验 B 范围 PN-EN 60068-2-2:2009","test_object_zh":"低压电子与电气产品，含照明与信息技术产品","search_en":"Low-voltage electronic and electrical products, including lighting and information technology products Resistance to dry heat Test B Range PN-EN 60068-2-2:2009"},{"_id":"6a5dc9a9f1c10c8ce825a072","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne","test_object_en":"Low-voltage electronic and electrical products, including lighting and information technology products","methodology":"Odporność na zmiany temperatury Próba N","methodology_en":"Resistance to change of temperature Test N","parameters":[{"name":"Zakres","range":"(-40 – +105) °C"}],"parameters_en":[{"name":"Range","range":"(-40 – +105) °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na zmiany temperatury Próba N\nZakres (-40 – +105) °C","reference":"PN-EN 60068-2-14:2024-04","norm_bases":["PN-EN 60068-2-14:2024-04"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Wyroby elektroniczne i elektryczne niskiego napięcia, w tym oświetleniowe i informatyczne Odporność na zmiany temperatury Próba N\nZakres (-40 – +105) °C PN-EN 60068-2-14:2024-04 Wyroby elektroniczne i elektryczne niskiego napiecia, w tym oswietleniowe i informatyczne Odpornosc na zmiany temperatury Proba N\nZakres (-40 – +105) °C PN-EN 60068-2-14:2024-04","categories":["electronics"],"row_index":2,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐温度变化性 试验 N","parameters_zh":[{"name":"范围","range":"(-40 – +105) °C"}],"search_zh":"低压电子与电气产品，含照明与信息技术产品 耐温度变化性 试验 N 范围 PN-EN 60068-2-14:2024-04","test_object_zh":"低压电子与电气产品，含照明与信息技术产品","search_en":"Low-voltage electronic and electrical products, including lighting and information technology products Resistance to change of temperature Test N Range PN-EN 60068-2-14:2024-04"},{"_id":"6a5dc9a9f1c10c8ce825a073","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Urządzenia, moduły i pakiety elektroniczne","test_object_en":"Electronic devices, modules and assemblies","methodology":"Odporność na zimno Próba A","methodology_en":"Resistance to cold Test A","parameters":[{"name":"Zakres","range":"do -40 °C"}],"parameters_en":[{"name":"Range","range":"do -40 °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na zimno Próba A\nZakres do -40 °C","reference":"PN-EN 60068-2-1:2009","norm_bases":["PN-EN 60068-2-1:2009"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Urządzenia, moduły i pakiety elektroniczne Odporność na zimno Próba A\nZakres do -40 °C PN-EN 60068-2-1:2009 Urzadzenia, moduly i pakiety elektroniczne Odpornosc na zimno Proba A\nZakres do -40 °C PN-EN 60068-2-1:2009","categories":["electronics"],"row_index":3,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐低温性 试验 A","parameters_zh":[{"name":"范围","range":"do -40 °C"}],"search_zh":"电子装置、模块与组件 耐低温性 试验 A 范围 PN-EN 60068-2-1:2009","test_object_zh":"电子装置、模块与组件","search_en":"Electronic devices, modules and assemblies Resistance to cold Test A Range PN-EN 60068-2-1:2009"},{"_id":"6a5dc9a9f1c10c8ce825a074","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Urządzenia, moduły i pakiety elektroniczne","test_object_en":"Electronic devices, modules and assemblies","methodology":"Odporność na suche gorąco Próba B","methodology_en":"Resistance to dry heat Test B","parameters":[{"name":"Zakres","range":"do +105 °C"}],"parameters_en":[{"name":"Range","range":"do +105 °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na suche gorąco Próba B\nZakres do +105 °C","reference":"PN-EN 60068-2-2:2009","norm_bases":["PN-EN 60068-2-2:2009"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Urządzenia, moduły i pakiety elektroniczne Odporność na suche gorąco Próba B\nZakres do +105 °C PN-EN 60068-2-2:2009 Urzadzenia, moduly i pakiety elektroniczne Odpornosc na suche goraco Proba B\nZakres do +105 °C PN-EN 60068-2-2:2009","categories":["electronics"],"row_index":4,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐干热性 试验 B","parameters_zh":[{"name":"范围","range":"do +105 °C"}],"search_zh":"电子装置、模块与组件 耐干热性 试验 B 范围 PN-EN 60068-2-2:2009","test_object_zh":"电子装置、模块与组件","search_en":"Electronic devices, modules and assemblies Resistance to dry heat Test B Range PN-EN 60068-2-2:2009"},{"_id":"6a5dc9a9f1c10c8ce825a075","lab_id":"69ad52a3de79e566650fb9a3","country":"PL","accr_number":"AB 1804","accr_body":"PCA","test_object":"Urządzenia, moduły i pakiety elektroniczne","test_object_en":"Electronic devices, modules and assemblies","methodology":"Odporność na zmiany temperatury Próba N","methodology_en":"Resistance to change of temperature Test N","parameters":[{"name":"Zakres","range":"(-40 – +105) °C"}],"parameters_en":[{"name":"Range","range":"(-40 – +105) °C"}],"technique":null,"techniques":[],"technique_en":null,"computed":[],"computed_en":[],"activity":"Odporność na zmiany temperatury Próba N\nZakres (-40 – +105) °C","reference":"PN-EN 60068-2-14:2024-04","norm_bases":["PN-EN 60068-2-14:2024-04"],"lab_section":null,"lab_section_en":null,"lab_address":null,"regulatory_area":null,"regulatory_area_en":null,"search_text":"Urządzenia, moduły i pakiety elektroniczne Odporność na zmiany temperatury Próba N\nZakres (-40 – +105) °C PN-EN 60068-2-14:2024-04 Urzadzenia, moduly i pakiety elektroniczne Odpornosc na zmiany temperatury Proba N\nZakres (-40 – +105) °C PN-EN 60068-2-14:2024-04","categories":["electronics"],"row_index":5,"parse_version":3,"parse_source":"script-pdfplumber","methodology_zh":"耐温度变化性 试验 N","parameters_zh":[{"name":"范围","range":"(-40 – +105) °C"}],"search_zh":"电子装置、模块与组件 耐温度变化性 试验 N 范围 PN-EN 60068-2-14:2024-04","test_object_zh":"电子装置、模块与组件","search_en":"Electronic devices, modules and assemblies Resistance to change of temperature Test N Range PN-EN 60068-2-14:2024-04"}],"has_pdf":true}